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A new method for measuring secondary electron emission yield from Nd surface bombarded by ions from a laser-ion source

Tamura Koji, Ogura Koichi, Shibata Takemasa

Jpn. J. Appl. Phys., Part 1, vol: 37, num: 9A, 5005-5007, published: , JP


   Electrical properties of solids.
      Normal (non-superconducting) metals.
         Emission phenomena and electron spectroscopy.
            Secondary emission.

   Laser physics.
      Laser action on matter.
         Laser action on atoms and molecules.
            Atoms and molecules photoionization.

   Laser physics.
      Laser applications: Physical bases.
         Precision measurements.
            Other topics in precision measurements.

   Radiophysics. Physical electronics.
      Electron and ion emission. Spectroscopy.
         Electron emission.
            Secondary electron emission.
               From metals and their compounds.