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Analysis of the TID Induced Failure Modes in NOR and NAND Flash Memories

Yihua Yan, Wei Chen, Ruyu Fan, Xiaoqiang Guo, Hongxia Guo, Fengqi Zhang, Lili Ding, Keying Zhang, Dongsheng Lin, Yuanming Wang

IEEE Trans. Nucl. Sci. Pt 2, vol: 60, num: 1, 224 - 229, published: 01 February 2013,


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