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Thermal regulator for IC temperature characterization using a microprobe station

Baderna D., Cabrini A., Torelli G.

IEEE Trans. Instrum. and Meas., vol: 55, num: 3, 754-760, published: , US

   Nuclear reactor physics.
      Nuclear power. Reliability and safety problems. Engineering problems.
            Diagnostics and analysis of processes in coolants and moderators.