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Traceable Quantitative Raman Microscopy and X-ray Fluorescence Analysis as Nondestructive Methods for the Characterization of Cu(In,Ga)Se2 Absorber Films

Sabine Zakel, Beatrix Pollakowski, Cornelia Streeck, Stefan Wundrack, Alfons Weber, Stefan Brunken, Roland Mainz, Burckhardt Beckhoff, and Rainer Stosch

Appl. Spectrosc. , vol: 70, num: 2, 279-288, published: 01 February 2016,


   Optics.
      Optics of molecules.
         Emission and absorption.

   Optics.
      Optics of atoms and ions
         Emission and absorption.

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